Engineered for the rigors of modern industrial inspection, the NDT1313D Flat Panel Detector sets a new benchmark for speed and clarity in non-destructive testing. Its “Fast Response, High-Efficiency Imaging” capability is powered by advanced a-Si/IGZO sensor technology and a versatile perovskite/CsI/GOS scintillator, delivering exceptional detail and rapid frame rates. This detector is purpose-built to enhance the quality and accelerate the pace of industrial workflows, providing reliable, high-resolution digital radiography for demanding applications in micro-focus, semiconductor, battery testing, and small casting inspection. It is the intelligent solution for precision-focused quality control.
Key Features
- Fast Response, High-Efficiency Imaging: Engineered for rapid data acquisition and processing, delivering clear images swiftly to boost production line throughput and inspection efficiency.
- Advanced Dual Sensor Platform: Leverages cutting-edge a-Si / IGZO technology for superior imaging performance, offering excellent sensitivity and low noise for defect detection.
- High-Resolution & High Frame Rate: Achieves a limiting spatial resolution of 5.88 lp/mm for fine detail capture, with a flexible frame rate of 20 fps (up to 40 fps with 2×2 binning) for dynamic or high-speed inspection needs.
- Versatile Scintillator Options: Configurable with perovskite, cesium iodide (CsI), or GOS scintillators to optimize performance for specific X-ray energy ranges and application requirements.
- Robust Industrial Design: Built with a compact, durable housing (176x176x37.5mm) to withstand industrial environments, ensuring reliable operation and easy integration into various inspection systems.
- Broad Energy Range Compatibility: Supports a wide energy range from 160 kV to 250 kV, making it suitable for inspecting a variety of material densities and thicknesses.
Technical Specifications
| Parameter | Specification |
|---|---|
| Detector Model | NDT1313D |
| Detector Type | a-Si / IGZO |
| Scintillator Type | Perovskite / Cesium Iodide (CsI) / GOS |
| Dimensions (L x W x H) | 176 x 176 x 37.5 mm |
| Weight | 2.1 kg / 3.5 kg |
| Power Consumption | 15 W |
| Effective Imaging Area | 129.0 x 129.0 mm |
| Pixel Size | 84 µm |
| Pixel Matrix | 1536 x 1536 |
| Frame Rate | 20 fps / 40 fps (with 2×2 binning) |
| Limiting Spatial Resolution | 5.88 lp/mm |
| A/D Conversion | 16 bit |
| Data Interface | Gigabit Ethernet (GigE) |
| Operating Temperature | 5 ~ 35 °C |
| Storage Temperature | 0 ~ 50 °C |
| Operating Humidity | 20 ~ 80% RH (Non-condensing) |
| Storage Humidity | 10 ~ 90% RH (Non-condensing) |
| Energy Range | 160 kV / 250 kV |
Primary Application Fields
The NDT1313D is specifically designed to elevate quality control standards in precision industrial sectors, including:
- Micro-focus Imaging & Electronics Inspection
- Semiconductor Component Analysis
- Battery Cell & Module Inspection (NDT)
- Small Casting and Welding Defect Detection
- General Precision Non-Destructive Testing (NDT)
Empower your industrial inspection process with the NDT1313D Flat Panel Detector. Its core promise of “Fast Response, High-Efficiency Imaging” directly translates to improved productivity, enhanced defect detection capability, and superior quality assurance, helping to elevate both the speed and quality of industrial inspection.
